Helios NanoLab DualBeam
In materials science, the challenge for researchers is to continually improve the quality of materials and devices being fabricated. Understanding structural and compositional details down to the nanoscale is paramount to achieving technology advancements. Helios NanoLab DualBeam is designed to deliver multi-scale, multi-dimensional insights, down to sub-nm resolution. Helios NanoLab DualBeam also rapidly produces the highest quality samples for atomic resolution S/TEM imaging. Designed for maximum usability and as a platform to address varying industry needs the high precision, engineered design is a positive reflection on the FEI brand.